|
Throughput Rates of Digital
Systems
The electrical resistance strain gage is an
inherently analog device that utilizes changes in the
relative resistance of the gage to quantify
mechanical strains in the surface to which it is
attached. Of course, as readers probably already
know, the strain gage is typically connected to some
form of instrumentation that incorporates a
Wheatstone bridge circuit to provide an analog
electrical signal that varies as the strain changes.
Indeed, most sensors -- whether they be
strain-gage-based transducers, LVDT's,
thermocouples, piezoelectric devices, or a wide
variety of others -- ultimately produce such a
signal.
Unfortunately, the digital computers increasingly
incorporated into measurement systems are inherently
incompatible with these analog signals. To store
measurement data in digital form, the analog signal
must be sampled at various points in time and
converted to numbers, i.e., the signal must be
digitized. Ideally, the time between samples should
be vanishingly small (approaching zero). But we know
from arithmetic that anything divided by zero is
infinitely large. And, of course, the computer can
only handle a finite number of data points. The
question then becomes how infrequently to sample. If
the signal is oscillating on a regular basis, then a
minimum of ten data points per period, for the
highest frequency component to reasonably reconstruct
the signal in the time domain, are required. In the
frequency domain, any rate of more than two samples
per period will suffice. In order for these
conditions to be met, a digital measurement system
must have a sufficient throughput rate.
(continued...)
Page 9 of 24
|