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Strain Measurement Errors
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Strain Measurement Errors |
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Gage Resistance Sources
On the third level, resistance changes in the grid may be caused by effects other than strain along its axis. This occurs when the temperature changes significantly during testing. The gage resistance will then be modified by the thermal output characteristics of the gage (Tech Note TN-504, Strain Gage Thermal Output and Gage Factor Variation with Temperature ). Strain gages undergoing cyclic loading may experience fatigue-induced resistance changes unrelated to strain (Tech Note TN-508, Fatigue Characteristics of Micro-Measurements Strain Gages ). Additionally, the gage resistance can be altered, to a small degree, by the strain perpendicular to the gage axis; i.e., by the transverse sensitivity of the gage to strain (Tech Note TN-509, Errors Due to Transverse Sensitivity in Strain Gages ). 
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