Thermal Output (continued)
Thermal output is caused by two concurrent and
algebraically additive effects in the strain gage
installation. First, the electrical resistivity of
the grid conductor is somewhat temperature dependent;
and, as a result, the gage resistance varies with
temperature. The second contribution to thermal
output is due to the differential thermal expansion
between the grid conductor and the test part or
substrate material to which the gage is bonded. With
temperature change, the substrate expands or
contracts; and, since the strain gage is firmly
bonded to the substrate, the gage grid is forced to
undergo the same expansion or contraction. To the
extent that the thermal expansion coefficient of the
grid differs from that of the substrate, the grid is
mechanically strained in conforming to the free
expansion or contraction of the substrate. Because
the grid is, by design, strain sensitive, the gage
exhibits a resistance change proportional to the
differential expansion.
Each of the two thermally induced resistance
changes may be either positive or negative in sign
with respect to that of the temperature change, and
the net thermal output of the strain gage is the
algebraic sum of these. Thus, expressed in terms of
unit resistance change, the thermal output
becomes:
Eq.(504.1)
where, in consistent units:
= unit change in resistance from the initial
reference resistance,
, due to thermal output.
= thermal coefficient of resistance of the grid
conductor.
= gage factor of the strain gage.
= transverse sensitivity of the strain gage.
= Poisson's ratio (0.285) of the standard test
material used in calibrating the gage for its gage
factor.
= difference in thermal expansion coefficients
between substrate and grid, respectively.
= temperature change from an arbitrary initial
reference temperature.
(
In this publication, the gage factor of the strain
gage (as specified by the package technical data
sheet) is identified as
, to distinguish it from the gage factor setting of
the measuring instrument, denoted here by
. This distinction is important, since the gage
factor setting of the instrument may sometimes, as a
matter of convenience or utility, be different from
that of the gage.
)
The correction factor for transverse sensitivity [
] is included in Eq. (504.1) to account for the fact
that the strain in the gage grid due to differential
thermal expansion is equal-biaxial, while the gage
factor,
, refers to the strain sensitivity as calibrated in a
uniaxial stress state, with a principal strain ratio
of 1/(-0.285).
It should not be assumed from the form of
Eq.(504.1) that the thermal output is linear with
temperature change, because all of the coefficients
within the brackets are themselves functions of
temperature. The equation clearly demonstrates,
however, that thermal output depends not only on the
nature of the strain gage, but also on the material
to which the gage is bonded. Because of this, thermal
output data are meaningful only when referred to a
particular type of strain gage, bonded to a specified
substrate material.
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