E/H (Ta2N) (Military M/D55342) product information

QPL MIL-PRF-55342 Qualified Ta2N Thin Film Resistor, Surface Mount Chip

 E/H (Ta2N) (Military M/D55342) Datasheet


  • Established reliability, “R” and “U” failure rate level (0.01 % per 1000 h), C = 2
  • High purity alumina substrate
  • Wraparound termination featuring a tenacious adhesion layer covered with an electroplated nickel barrier layer for  +150 C operating conditions

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General Information
Land Patterns - Vishay Dale Thin Film Land Patterns
Product Literature
Product Sheet - E/H - Tantalum Nitride QPL Qualified Precision Thin Film Resistor
Selector Guide - Military and Aerospace Applications
Product Support
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